ELECTRON MICROSCOPY
The electron microscope facilities of the CRNN consists of a 200 KV Transmission Electron Microscope system, a Field-emission Scanning Electron Microscope and a Variable Pressure Scanning Electron Microscope for investigation of biological materials.
TRANSMISSION ELECTRON MICROSCOPY
MODEL: JEOL JEM 2100 HR with EELS
TITLE | DESCRIPTION |
Resolution | Point to Point resolution of 0.23 nm & lattice resolution of 0.14 nm |
Accl. Voltage | 80 KV to 200 KV |
Modes of Operation | TEM, EDS, NBD & CBD |
Source | LaB6 |
Sample holders | Heating holder (800C) |
Cooling holder (-160C) | |
Tilting holder | |
Straining holder | |
Cryotransfer system | |
EDS | INCA Energy TEM 200 with analysis software |
EELS | Model 963 GIF Quantum Imaging Filter System |
Energy resolution:0.7ev | |
EELS/EFTEM software |
FIELD EMISSION SCANNING ELECTRON MICROSCOPY
MODEL JEOL JSM-7600F
TITLE | DESCRIPTION |
Voltage | 100V to 30KV |
Source | Thermal Field Emission Gun (ZrO-W) |
Resolution | 1 nm at 15KV & 1.5 nm at 1KV |
Probe current | up to 200A |
Detectors | Secondary Electron Detector |
Back-scatter Electron Detector | |
EDS/EBSD | INCA Energy 250 & HKL Advanced EBSD system |
CL | Mono CL 4 (Gatan) |
SCANNING ELECTRON MICROSCOPE for Biological Samples
MODEL: ZEISS EVO 18 SPECIAL EDITION
TITLE | DESCRIPTION |
Resolution | 3nm |
Source | Tungsten Filament |
Antimony | |
EDS | INCA Energy 250 Microanalysis System (EDS) |
Upgradation to life science model | Variable pressure range from 400 to 3000 Pa |
Extended pressure secondary electron detector | |
Water vapor introduction kit | |
Peltier cooled stage | |
Cryo transfer | Quorum Tech Cryo Transfer system |
In situ fracture | |
In situ coater |